Patent quality : Towards a systematic framework for analysis and measurement / Kyle W. Higham, Gaétan de Rassenfosse and Adam B. Jaffe

By: Contributor(s): Material type: TextTextSeries: NBER Working Papers ; 27598Publication details: Cambridge NBER 2020Description: 50pSubject(s): Online resources:
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Item type Current library Status Barcode
Working Papers (Electronic) Working Papers (Electronic) IGIDR Available E28528

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